Surface and Interface Analysis

Surface and interface analysis involves studying the outermost layers of materials to understand their properties and behaviors. Techniques like scanning tunneling microscopy (STM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS) offer insights into surface topography, composition, and electronic states. These analyses are crucial for applications in materials science, nanotechnology, and semiconductor manufacturing, helping to optimize performance and ensure quality in various technological fields.

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